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| A range of industries, including general scientific and materials research, optoelectronics, and data storage, require measurements of surface topography to either control their processes or research new material characteristics. Typical measurement parameters which we address include flatness, roughness, curvature, peak-to-valley, asperity, waviness, texture, volume, sphericity, slope, density, stress, bearing ratio, and distance mainly in the micron to nanometer range. |
Surface Metrology
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